Asian Journal of Information Technology
ISSN: Online 1993-5994ISSN: Print 1682-3915
100
Views
2
Downloads
Abstract
This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.
How to cite this article:
Jamil Al Azzeh, Daniel Monday Afodigbokwu, Denis Olegovich Bobyntsev and Igor Valerievich Zotov. Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips.
DOI: https://doi.org/10.36478/ajit.2016.3082.3086
URL: https://www.makhillpublications.co/view-article/1682-3915/ajit.2016.3082.3086