Pure Nickel Oxide (NiO) and thin films (NiO:Al) were prepared using a simple spray pyrolysis technique from hydrated Nickel Chloride salt solution (NiCl2 , 6H2 O). The optical, structural and morphological properties of the fabricated films have been investigated. X-ray diffraction studies revealed a polycrystalline nickel oxide phase with cubic crystalline structure, predominantly with 111, 200 and 222 oriented films. The highest measured optical transmittance in the visible range is 79%. The morphology of the surface samples of thin films were investigated by Atomic Force Microscopic (AFM).
Yahya Mustafa Abdul-Hussein, Adeeba Lafta Resne and Aqel Mashot Jafar. Fabrication and Characterization of NiO:Al Thin Films.
DOI: https://doi.org/10.36478/rjasci.2018.358.362
URL: https://www.makhillpublications.co/view-article/1815-932x/rjasci.2018.358.362