TY  - JOUR
T1  - Sidewall Roughness in Y-Shaped Waveguide: The Effect to the Signal Quality
AU - Syuhaimi Ab-Rahman, Mohammad AU - Shyan Hwang, I. AU - Najahah Abd Aziz, Ainon AU - Ater Saleh, Foze 
JO  - Journal of Engineering and Applied Sciences
VL  - 14
IS  - 21
SP  - 7841
EP  - 7845
PY  - 2019
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2019.7841.7845
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2019.7841.7845
KW  - optical signal
KW  -linear structure
KW  -signal quality
KW  -optical splitter
KW  -Sidewall roughness
KW  -Q-factor
AB  - In this study the level of sidewall roughness was monitored with depth and structure of roughness
to see its effect to signal quality of optical network. Sidewall roughness is contributes to scattering loss in
waveguide and leads to signal distortion. Y-shaped waveguide to develop 1×2 optical splitter was designed
with 6 different roughness depth and roughness was placed at 3 different structures. 1×2 optical splitter
waveguide integrated into optical network and the signal quality analyzed by its Q-factor. Simulation results
show that Q-factor values was decreasing as roughness get deeper on 0.6 μm and sidewall roughness
on s-bend structure also, contributes to higher signal distortion compares to roughness on linear structure.
Therefore, it is necessary for us to monitor the level of sidewall roughness to ensure the quality of optical
signal.
ER  -