TY  - JOUR
T1  - Laser Effect on Optical and Structural Properties of CdTe: Al Thin Films
Prepared by Pulsed Laser Deposition Technique
AU - H. Hwidi, Mohammed AU - Abduljabbar, Laith M. AU - Emad, Amna 
JO  - Journal of Engineering and Applied Sciences
VL  - 14
IS  - 7
SP  - 2302
EP  - 2308
PY  - 2019
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2019.2302.2308
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2019.2302.2308
KW  - thin film
KW  -Laser
KW  -CdTe
KW  -Al
KW  -XRD
KW  -telluride films
KW  -X-ray
AB  - Thin films of cadmium telluride were deposited using (PLD) technique on a several glass substrates
at average temperature range of 300°C. Different cadmium telluride thin films which has a thickness (250, 350
and 450 nm) were used in this study. Properties of cadmium telluride films such as (optical and structural) were
studied. All optical charact eristics of the preparation films were characterized using FTIR spectrophotometer
(Shimadzu 8400 S) in the range (300-1800) nm. From this measurements, the band gaps energies for different
fabricated thickness (250, 350 and 450 nm) were found to be 2.35, 2.565 and 2.76 eV, respectively. The values
of the band gaps increased with increasing the thickness of the fabricated films. The alterations of crystalline
structure of the prepared thin films were analyzed and studied using XRD procedure. Diffractometer (Shimadzu
6000 made in Japan) was used in the measurements of XRD. The X-ray measurements showed that all CdTe
samples are consisting of randomly oriented crystalline parts and have a structure of cubic zinc blend with
preferential mode in the [111] direction. The particle size and a lattice constant of the fabricated cadmium
telluride films were calculated. The films with higher thickness which has a grain size greater than the other
samples.
ER  -