TY  - JOUR
T1  - Characterization of a Zinc Oxidethin Film Used Simple Chemical Method
AU - M. Jawad, Huda AU - N. Abd, Ahmed AU - M. Abdulridha, Wasna’a 
JO  - Journal of Engineering and Applied Sciences
VL  - 13
IS  - 18
SP  - 7537
EP  - 7540
PY  - 2018
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2018.7537.7540
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2018.7537.7540
KW  - Manuscript
KW  -ZnO
KW  -topographical
KW  -synthesized
KW  -XRD
KW  -AFM
AB  - This manuscript describes synthesizeof Zinc Oxide (ZnO) thin film by simple chemical method. The
structural, topographical and th optical properties of the synthesized thin film were studied by using X-Ray
Diffraction (XRD), Atomic Force Microscopy (AFM), Fourier-Transform Infrared Spectroscopy (FTIR), UV-Vis
absorption and Optical microscope (OP) image. The XRD pattern of ZnO thin film deposited on a substrate of
glass shows polycrystalline structure, the wurtzite structure with average crystallite size 36.207 nm was
appeared. While 3D AFM image show 42.35 nm average grain size with 2.69 and 3.19 nm for each roughness
average and root mean square, respectively. PL spectra of ZnO thin film revealse that the emission wavelength
of ZnO thin film equal to 400 nm and emission energy of the film (3.1 eV).
ER  -