TY  - JOUR
T1  - Dark and Photo-Conductivity Measurement Techniques for Dielectric Materials, Application to LiNbO<SUB>3</SUB>
AU - Benyoucef, B. AU - Chikh-Bled, B. AU - Aillerie, M. 
JO  - Journal of Engineering and Applied Sciences
VL  - 6
IS  - 2
SP  - 163
EP  - 167
PY  - 2011
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2011.163.167
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2011.163.167
KW  - damage
KW  -:Lithium niobate
KW  -electrical conductivity
KW  -energy of activation
KW  -photo-conductivity
KW  -photo-refractive
KW  -threshold
AB  - Dark conductivity and photo-conductivity are the two mains charge transport phenomena involved in photo-refractive effect. These effects are associated to the optical damage which is controlled for holographic applications but is a drawback for telecom ones. Various techniques exist for measuring these effects and among them, we present quite direct measurements techniques useful for qualification of materials. Within these techniques, various parameters can be taken into consideration as the temperature, the wavelength and the power of the laser beam and additional physical properties of the material under study can be determined as the activation energy or the damage threshold. Some results obtained with pure and doped lithium niobate crystals, illustrate this study.
ER  -