TY  - JOUR
T1  - Surface Analysis of Optical Flint Substrate by Multiple Angle Ellipsometric Method
AU - , Ai Manallah AU - , M. Bouafia AU - , D.J. Bouzid 
JO  - Journal of Engineering and Applied Sciences
VL  - 2
IS  - 10
SP  - 1519
EP  - 1523
PY  - 2007
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2007.1519.1523
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2007.1519.1523
KW  - Ellipsometry
KW  -effective medium
KW  -surface roughness
KW  -optical testing
KW  -polishing
AB  - The present research consists in characterizing the surface quality of polished optical glass (LF7) by ellipsometry and use of effective medium model. A correlation between effective roughness layer and ellipsometric measurements has been established as glass fraction f %. Ellipsometric parameters in dependence of polishing time have been measured and treated on the base of the theory of Maxwell-Garnett assuming an effective medium layer of effective thickness d<SUB>e</SUB> and refractive index n<SUB>e</SUB>.
ER  -