TY  - JOUR
T1  - A High Frequency Characterization of a Thin Film Ferrite,  Application to the BaM and YIG
AU - , Z.Zerrougui AU - , A. Merzouki AU - , D. Vincent 
JO  - Journal of Engineering and Applied Sciences
VL  - 1
IS  - 4
SP  - 428
EP  - 433
PY  - 2006
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2006.428.433
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2006.428.433
KW  - Anisotropic media
KW  -ferrites
KW  -ferrites thin film
KW  -microwave measurement
KW  -permeability tensor
AB  - New microwave electronic technology challenges require integration of many passive components on chips. Among them, isolators and circulators are non reciprocal passive devices which contain magnetic materials. Hence, it is important to know the magnetic properties. The permeability tensor is the most important parameter to define, because it governs the interaction between the wave and the material, origin of all magnetic phenomenons. Our study consists in doing the characterization of thin film of BaM and YIG over frequency range of 0.4 to 65 GHz, shows specially gyroresonance phenomenon and finds resonance frequencies. The technique is based on the S parameters measurement of the magnetic materials with a network Analyser and a probe tester. Polder’s model is used to calculate the different elements of the permeability tensor, which consider the ferrite at its saturated state. The results are discussed and compared to those obtained by using a Spectral Domain Approach (SDA).
ER  -