TY  - JOUR
T1  - Fabrication and Characterization of NiO:Al Thin Films
AU - Abdul-Hussein, Yahya Mustafa AU - Resne, Adeeba Lafta AU - Jafar, Aqel Mashot 
JO  - Research Journal of Applied Sciences
VL  - 13
IS  - 6
SP  - 358
EP  - 362
PY  - 2018
DA  - 2001/08/19
SN  - 1815-932x
DO  - rjasci.2018.358.362
UR  - https://makhillpublications.co/view-article.php?doi=rjasci.2018.358.362
KW  - structural properties
KW  -Optical properties
KW  -NiO thin films
KW  -doping
KW  -transmittance
KW  -samples
AB  - Pure Nickel Oxide (NiO) and thin films (NiO:Al) were prepared using a simple spray pyrolysis
technique from hydrated Nickel Chloride salt solution (NiCl<sub>2</sub> , 6H<sub>2</sub> O). The optical, structural and morphological 
properties of the fabricated films have been investigated. X-ray diffraction studies revealed a polycrystalline
nickel oxide phase with cubic crystalline structure, predominantly with 111, 200 and 222 oriented films. The
highest measured optical transmittance in the visible range is 79%. The morphology of the surface samples of
thin films were investigated by Atomic Force Microscopic (AFM).
ER  -