TY  - JOUR
T1  - Automatic Fault Analysis of Textile Fabric Using Imaging Systems
AU - , P. Sengottuvelan AU - , Amitabh Wahi AU - , A. Shanmugam 
JO  - Research Journal of Applied Sciences
VL  - 3
IS  - 1
SP  - 26
EP  - 31
PY  - 2008
DA  - 2001/08/19
SN  - 1815-932x
DO  - rjasci.2008.26.31
UR  - https://makhillpublications.co/view-article.php?doi=rjasci.2008.26.31
KW  - Fabric defects
KW  -intensity change
KW  -spatial frequency
KW  -fourier analysis
KW  -histogram equalization
KW  -texture analysis
AB  - Quality is the watchword for any type of business. A product without quality leads to only loss and lack of customer satisfaction. This is true in the case of textile industries also. The various faults occurring in the fabric leads to low quality cloth material. Many fabric defects are very small and undistinguishable, which are very difficult to detect by only monitoring the intensity change. Faultless fabric is a repetitive and regular global texture and Fourier transform can be applied to monitor the spatial frequency spectrum of a fabric When a defect occurs in fabric, its regular structure is changed so that the corresponding intensity at some specific positions of the frequency spectrum would change. In this study, a simulated fabric model is used to understand the relationship between the fabric structure in the image space and in the frequency space. Based on the three-dimensional frequency spectrum, 2 significant spectrum diagrams are defined and used for analyzing the fabric defect. These 2 diagrams are called the central spatial frequency spectrums. The defects are broadly classified into 3 classes: Double yarn; missing yarn and webs or broken fabric. After evaluating these 3 classes of defects using some simulated models and real samples, seven characteristic parameters for central spatial frequency are computed.
ER  -