TY  - JOUR
T1  - Intelligent Instrumentation Approach to Semiconductor Temperature Measurement by Analogue Transmission Using a Z80 Microcomputer
AU - , A.A. Adegbemile 
JO  - Research Journal of Applied Sciences
VL  - 2
IS  - 8
SP  - 859
EP  - 864
PY  - 2007
DA  - 2001/08/19
SN  - 1815-932x
DO  - rjasci.2007.859.864
UR  - https://makhillpublications.co/view-article.php?doi=rjasci.2007.859.864
KW  - Temperature
KW  -transducer
KW  -analogue to digital converter
KW  -measurement and Z80 microprocessor
AB  - A Z80 microcomputer based instrumentation which makes use of semiconductor transducer, analogue to digital converter and which samples temperatures at 1 min interval at a point where it may vary in the range of 0-100 C was examined.  The 8 bit binary code output of the Analogue to Digital Converter (ADC) and the  corresponding  temperature values were obtained with an input voltage range of 0-8V increased at an interval of 0.5 V.  The ADC total levels of 256 and the resolution of 31.25 mV were determined. A hierarchical decomposition diagram, a proper structural description and a pseudo-code description of the modules of the software routines at all levels were developed to store the 256 temperature values and compute the highest, lowest, average and the number of temperature which exceed 50 C.
ER  -