TY  - JOUR
T1  - Hybrid Architecture for Overlapped Test Vector Compression
AU - Rooban, S. AU - Manimegalai, R. 
JO  - Asian Journal of Information Technology
VL  - 15
IS  - 21
SP  - 4392
EP  - 4399
PY  - 2016
DA  - 2001/08/19
SN  - 1682-3915
DO  - ajit.2016.4392.4399
UR  - https://makhillpublications.co/view-article.php?doi=ajit.2016.4392.4399
KW  - Built-in self-test
KW  -hybrid low power compression
KW  -low power test
KW  -test data compression
KW  -scanbased test
KW  -toggling
AB  - This study depicts novel programmable low power test data compression architecture that permits
formation of entropy encoded test scan envelope with exact and adaptable design in context of achieving
continuous adjustment with the overlapped test vectors. The proposed architecture proficiently consolidates
test compression with logic gates where both software and hardware strategies can work synergistically to
convey top-notch test vector compression. Experimental results got from the simulation of proposed
architecture add attainability of the proposed scheme and are accounted for test vector compression using
hybrid i.e., both hardware and software based test data compression.
ER  -