TY  - JOUR
T1  - Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips
AU - Azzeh, Jamil Al AU - Afodigbokwu, Daniel Monday AU - Bobyntsev, Denis Olegovich AU - Zotov, Igor Valerievich 
JO  - Asian Journal of Information Technology
VL  - 15
IS  - 16
SP  - 3082
EP  - 3086
PY  - 2016
DA  - 2001/08/19
SN  - 1682-3915
DO  - ajit.2016.3082.3086
UR  - https://makhillpublications.co/view-article.php?doi=ajit.2016.3082.3086
KW  - Embedded-core-based system-on-chips
KW  -testing
KW  -self-test
KW  -oscillation-based methodology
KW  -analog systems
KW  -mixed-signal systems
KW  -fault model
KW  -test procedure
AB  - This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.
ER  -