@article{MAKHILLJEAS201914817662,
    title = {An Efficient Use of Memory Grouping Algorithm for Implementation of
BIST in Self Test},
    journal = {Journal of Engineering and Applied Sciences},
    volume = {14},
    number = {8},
    pages = {2695-2700},
    year = {2019},
    issn = {1816-949x},
    doi = {jeasci.2019.2695.2700},
    url = {https://makhillpublications.co/view-article.php?issn=1816-949x&doi=jeasci.2019.2695.2700},
    author = {Sunil,O.P.,G.R. and},
    keywords = {Design for test,memory grouping,built in self test,test time,testing memories,BIST},
    abstract = {Design for test engineers has to group memories for BIST implementation. But there are various
problems involved during memory grouping such as number of memories are increasing day by day and DFT
engineers spends lots of time on grouping memories for BIST structure. Also, the memories may have different
frequency of operation and the physical placement may also be different and scattered. This study presents
an algorithm to group the memory in an efficient way such that it reduces the effort of memory grouping for
BIST structure and BIST can support the grouping. Also, it take care the power during memory BIST operation.}
    }