@article{MAKHILLAJIT201615216493,
    title = {Hybrid Architecture for Overlapped Test Vector Compression},
    journal = {Asian Journal of Information Technology},
    volume = {15},
    number = {21},
    pages = {4392-4399},
    year = {2016},
    issn = {1682-3915},
    doi = {ajit.2016.4392.4399},
    url = {https://makhillpublications.co/view-article.php?issn=1682-3915&doi=ajit.2016.4392.4399},
    author = {S. and},
    keywords = {Built-in self-test,hybrid low power compression,low power test,test data compression,scanbased test,toggling},
    abstract = {This study depicts novel programmable low power test data compression architecture that permits
formation of entropy encoded test scan envelope with exact and adaptable design in context of achieving
continuous adjustment with the overlapped test vectors. The proposed architecture proficiently consolidates
test compression with logic gates where both software and hardware strategies can work synergistically to
convey top-notch test vector compression. Experimental results got from the simulation of proposed
architecture add attainability of the proposed scheme and are accounted for test vector compression using
hybrid i.e., both hardware and software based test data compression.}
    }