@article{MAKHILLAJIT201615166334,
    title = {Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips},
    journal = {Asian Journal of Information Technology},
    volume = {15},
    number = {16},
    pages = {3082-3086},
    year = {2016},
    issn = {1682-3915},
    doi = {ajit.2016.3082.3086},
    url = {https://makhillpublications.co/view-article.php?issn=1682-3915&doi=ajit.2016.3082.3086},
    author = {Jamil Al,Daniel Monday,Denis Olegovich and},
    keywords = {Embedded-core-based system-on-chips,testing,self-test,oscillation-based methodology,analog systems,mixed-signal systems,fault model,test procedure},
    abstract = {This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.}
    }